- design for test
- Printed circuits: DFT
Универсальный русско-английский словарь. Академик.ру. 2011.
design for test
Смотреть что такое "design for test" в других словарях:
Design For Test — (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and apply… … Wikipedia
Design for testing — Design for Test (aka Design for Testability or DFT ) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier to develop and… … Wikipedia
Design for X — Under the label Design for X, a wide collection of specific design guidelines are summarized. Each design guideline addresses a particular issue that is caused by, or affects the characteristics of a product. The design guidelines themselves… … Wikipedia
Design For Testability (DfT) — Design for Testability, très approximativement traduisible par Conception pour le Test ou l Analyse. Le terme Design for Testability (ou DfT) est un terme utilisé en conception de composants électroniques complexes (notamment microprocesseur,… … Wikipédia en Français
Design for testability — (DfT) Design for Testability, très approximativement traduisible par Conception pour le Test ou l Analyse. Le terme Design for Testability (ou DfT) est un terme utilisé en conception de composants électroniques complexes (notamment… … Wikipédia en Français
Design for testability (dft) — Design for Testability, très approximativement traduisible par Conception pour le Test ou l Analyse. Le terme Design for Testability (ou DfT) est un terme utilisé en conception de composants électroniques complexes (notamment microprocesseur,… … Wikipédia en Français
Design for Testability (DfT) — Design for Testability, très approximativement traduisible par Conception pour le Test ou l Analyse. Le terme Design for Testability (ou DfT) est un terme utilisé en conception de composants électroniques complexes (notamment microprocesseur,… … Wikipédia en Français
Design for manufacturability (IC) — For a general explanation outside the integrated circuit topic, see Design for manufacturability (disambiguation). Achieving high yielding designs in the state of the art, VLSI technology has become an extremely challenging task due to the… … Wikipedia
Design for Manufacturing — DFM ou Design for Manufacturing ou encore Design for Manufacturability est l ensemble des règles utilisées en électronique et tout particulièrement dans l industrie des semiconducteurs afin de concevoir des composantes qui puissent être… … Wikipédia en Français
Test Engineering — (TE) is generally defined as the application of one or more engineering branches (such as Electrical Engineering, Mechanical Engineering, Genetic Engineering, etc.) and/or the application of one or more pure scientific disciplines (such as… … Wikipedia
Test plan — A test plan is a systematic approach to testing a system such as a machine or software. The plan typically contains a detailed understanding of what the eventual workflow will be.Test plans in hardware developmentA test plan documents the… … Wikipedia
